AUTOMATIC DEFECT DETECTION AND CLASSIFICATION FOR HIGH THROUGHPUT ELECTRON CHANNELING CONTRAST IMAGING
Patent №
US 9,739,728
Granted
2017-08-22
Filed 2016
Owner
INTERNATIONAL BUSINESS MACHINES CORPORATION
Lab
AI components
2
ml · vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
15187467
Imaging and processing techniques are employed to identify crystalline defects obtained by ECCI from surrounding topography and is combined with defect counting and automatic classification.
AI classification
Vision1.00
Machine learning0.88
Evolutionary computation0.34
Planning0.06
AI hardware0.00
Knowledge representation0.00
Speech0.00
Natural language0.00
Ownership
INTERNATIONAL BUSINESS MACHINES CORPORATION
assignment · 397820914
Assignors
BEDELL, STEPHEN W., MO, RENEE T., MUKHERJEE, KUNAL, OTT, JOHN A., SADANA, DEVENDRA K., WACASER, BRENT A.
On an employer assignment, the assignors are typically the inventors.
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