Patent №
US 9,880,892
Granted
2018-01-30
Filed 2014
Owner
INTERNATIONAL BUSINESS MACHINES CORPORATION
Lab
AI components
2
planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
14187783
A method of managing semiconductor manufacturing defects, the method including: determining a cumulative aging parameter for each of a plurality of first IC products produced with a particular manufacturing line, the cumulative aging parameter being dependent on a product operating condition; calculating an observed defect rate for the plurality of first IC products based on a difference between a predicted value of a aging parameter and the cumulative aging parameter for each of the plurality of first IC products; and adjusting a manufacturing reliability model for the particular manufacturing line in response to the observed defect rate being different from an initial predicted defect rate for the plurality of first IC products wherein the manufacturing reliability model reestablishes the initial predicted defect rate.
AI classification
Ownership
INTERNATIONAL BUSINESS MACHINES CORPORATION
assignment · 322810438
Assignors
BICKFORD, JEANNE P. S., HABIB, NAZMUL, LI, BAOZHEN, NSAME, PASCAL A.
On an employer assignment, the assignors are typically the inventors.