SYSTEM FOR DIAGNOSING DEFECTS IN ELECTRONIC ASSEMBLIES

A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern search section (36) for comparing current test failure data to information stored in the knowledge base (26). A voting section (40) is also provided for generating a recommended repair procedure to eliminate the defect in the electronic assembly (12). Finally, the system (20) further comprises a historical pattern generation section (46) which updates the knowledge base (26) with information regarding whether the recommended repair procedure eliminated the defect.