METHOD FOR CALCULATING ADAPTIVE INFERENCE TEST FIGURE OF MERIT

A method for using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. The steps include performing a position-dependent, time-ordered test upon an electrical or electronic device or assembly to provide comprehensive error analysis. The error analysis includes a library of error information. Previously unobserved faults can be detected and located despite their possible remoteness within the device or assembly. When detected faults are compared with error library, a figure of merit is calculated for all possibilities of detected faults.