METHOD FOR THE HIERARCHICAL COMPARISON OF SCHEMATICS AND LAYOUTS OF ELECTRONIC COMPONENTS
Patent №
US 5,249,133
Granted
1993-09-28
Filed 1991
Owner
SUN MICROSYSTEMS, INC. A CORP. OF DELAWARE
Lab
—
AI components
2
kr · planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
07684047
The present invention takes advantage of the hierarchical nature of the design to perform a hierarchical comparison on as many blocks and sub-blocks which can be matched between the layout and the logic design. Because the internal connections were previously verified when the first occurrence of the block was compared, repetition of lengthy comparisons of multiple occurrences of the same blocks in the designs is avoided and subsequent comparisons are performed simply by comparing the input and output connections to the block.
AI classification
Ownership
SUN MICROSYSTEMS, INC. A CORP. OF DELAWARE
assignment · 57030045
Assignors
BATRA, PRADEEP
On an employer assignment, the assignors are typically the inventors.