INTEGRATED CIRCUIT PROBE CARD INSPECTION SYSTEM

Patent №

US 5,657,394

Granted

1997-08-12

Filed 1993

Owner

INTEGRATED TECHNOLOGY CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08072206

A system for inspecting integrated circuit probe cards using a video camera positioned to view probe points on the cards from below. A precision movement stage is used to move the video camera into a known position for viewing the probe points. Analysis of the video image and the stage position are used to determine the relative positions of the probe points.

VisionG01R 1/07307G01R 31/2887G01R 3/00

AI classification

Vision0.94
Natural language0.01
AI hardware0.00
Evolutionary computation0.00
Planning0.00
Knowledge representation0.00
Machine learning0.00
Speech0.00

Ownership

INTEGRATED TECHNOLOGY CORPORATION

assignment · 66780592

Assignors

SCHWARTZ, RODNEY E., WIRICK, GLENN M., ROGERS, GARY B.

On an employer assignment, the assignors are typically the inventors.

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