GUARDED TUB ENCLOSURE

Patent №

US 7,639,003

Granted

2009-12-29

Filed 2007

Owner

CASCADE MICROTECH, INC.

Lab

—

AI components

evo

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11786641

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A probe station with an improved guarding structure.

Evolutionary computationG01R 31/2862G01R 31/2886G01R 1/18G01R 31/2865

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Evolutionary computation0.57

Natural language0.03

Planning0.01

Machine learning0.01

Speech0.00

AI hardware0.00

Vision0.00

Knowledge representation0.00

Ownership

CASCADE MICROTECH, INC.

assignment · 192430348

Assignors

DUNKLEE, JOHN, NORGDEN, GREG, COWAN, C. EUGENE

On an employer assignment, the assignors are typically the inventors.

From the same owner

FOCUSING OPTICAL SYSTEMS AND METHODS FOR TESTING SEMICONDUCTORSUS 9,435,858 · 2016 OPTICALLY ENHANCED DIGITAL IMAGING SYSTEMUS 9,245,317 · 2016 SYSTEM FOR TESTING SEMICONDUCTORSUS 7,940,069 · 2011 METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARDUS 7,733,108 · 2010 SYSTEM FOR TESTING SEMICONDUCTORSUS 7,656,172 · 2010 INTERFACE FOR TESTING SEMICONDUCTORSUS 7,535,247 · 2009 BLUR DETECTION SYSTEMUS 7,181,082 · 2007 PROBE STATIONUS 6,777,964 · 2004

Cites (47)

PROBE DESIGNING APPARATUS AND PROBE DESIGNING METHODUS 7,035,738 · 2006 PROBE MARK READING DEVICE AND PROBE MARK READING METHODUS 7,026,832 · 2006 ELECTRIC CONDUCTIVITY WATER PROBEUS 7,019,541 · 2006 APPARATUS AND METHOD FOR THE TESTING OF CIRCUIT BOARDS, AND TEST PROBE FOR THIS APPARATUS AND THIS METHODUS 7,015,711 · 2006 NEEDLE FIXTURE OF A PROBE CARD IN SEMICONDUCTOR INSPECTION EQUIPMENT AND NEEDLE FIXING METHOD THEREOFUS 6,900,653 · 2005 MASSIVELY PARALLEL INTERFACE FOR ELECTRONIC CIRCUITSUS 6,812,718 · 2004 METHODOLOGY AND APPARATUS USING REAL-TIME OPTICAL SIGNAL FOR WAFER-LEVEL DEVICE DIELECTRICAL RELIABILITY STUDIESUS 6,788,093 · 2004 PROBE STATIONUS 6,777,964 · 2004 MULTI-PIXEL METHODS AND APPARATUS FOR ANALYSIS OF DEFECT INFORMATION FROM TEST STRUCTURES ON SEMICONDUCTOR DEVICESUS 6,771,806 · 2004 APPARATUS FOR DETECTING DEFECT IN DEVICE AND METHOD OF DETECTING DEFECTUS 6,734,687 · 2004 THERMAL LUMINESCENCE LIQUID MONITORING SYSTEM AND METHODUS 6,731,804 · 2004 REAL-TIME PHOTOEMISSION DETECTION SYSTEMUS 6,724,928 · 2004 METHODS AND APPARATUS FOR DETERMINING THE RELATIVE POSITIONS OF PROBE TIPS ON A PRINTED CIRCUIT BOARD PROBE CARDUS 6,710,798 · 2004 CALIBRATING A TEST SYSTEM USING UNKNOWN STANDARDSUS 6,643,597 · 2003 AUTOMATIC FOCUSING SYSTEM FOR SCANNING ELECTRON MICROSCOPE EQUIPPED WITH LASER DEFECT DETECTION FUNCTIONUS 6,621,082 · 2003 METHODS FOR ANALYZING PROTEIN BINDING EVENTSUS 6,566,079 · 2003 APPARATUS AND METHOD FOR ANALYZING FUNCTIONAL FAILURES IN INTEGRATED CIRCUITSUS 6,549,022 · 2003 MAGNETO-OPTICAL MICROSCOPE MAGNETOMETERUS 6,528,993 · 2003 INDEXING ROTATABLE CHUCK FOR A PROBE STATIONUS 6,483,336 · 2002 SCATTERING PARAMETER CALIBRATION SYSTEM AND METHODUS 6,300,775 · 2001 METHODS AND DEVICES FOR CARRYING OUT CHEMICAL REACTIONSUS 6,251,595 · 2001 SYSTEM AND METHOD FOR PROFILING CUSTOMERS FOR TARGETED MARKETINGUS 6,236,975 · 2001 COMPUTER INPLEMENTED MARKETING SYSTEMUS 6,236,977 · 2001 INTEGRATED TESTING METHOD AND APPARATUS FOR SEMICONDUCTOR TEST OPERATIONS PROCESSINGUS 6,137,303 · 2000 INTEGRATED CIRCUIT PROBE CARD INSPECTION SYSTEMUS 6,118,894 · 2000

and 22 more

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