Patent №
US 6,549,022
Granted
2003-04-15
Filed 2000
Owner
SANDIA NATIONAL LABORATORIES
+4 more
Lab
—
AI components
1
hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09586505
An apparatus and method are presented for identifying and mapping functional failures in an integrated circuit (IC) due to timing errors therein based on the generation of functional failures in the IC. This is done by providing a set of input test vectors to the IC and adjusting one or more: of the IC voltage, temperature or clock frequency; the rate at which the test vectors are provided to the IC; or the power level of a focused laser beam used to probe the IC and produce localized heating which changes the incidence of the functional failures in the IC which can be sensed for locating the IC circuit elements responsible for the functional failures. The present invention has applications for optimizing the design and fabrication of ICs, for failure analysis, and for qualification or validation testing of ICs.
AI classification
Ownership
SANDIA NATIONAL LABORATORIES
assignment · 111260273
SANDIA CORPORATION
correct · 126500703
ADVANCED MICRO DEVICES, INC.
assignment · 130370928
UNIVERSITY OF NEW MEXICO
assignment · 162740974
SCIENCE & TECHNOLOGY CORPORATION @ UNM
assignment · 162740987
Assignors
COLE, EDWARD I., JR., TANGYUNYONG, PAIBOON, HAWKINS, CHARLES F., BRUCE, MICHAEL R., BRUCE, VICTORIA J., RING, ROSALINDA M., COLE, JR., EDWARD I., TRANGYUNYONG, PAIBOON, HAWKINS, CHARLES F., BRUCE, MICHAEL R., BRUCE, VICTORIA J., RING, ROSALINDA M.
On an employer assignment, the assignors are typically the inventors.