Patent №
US 6,792,373
Granted
2004-09-14
Filed 2002
Owner
TEST ADVANTAGE, INC.
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10154627
A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising an outlier identification element configured to identify significant data in a set of test results. The test system may be configured to provide the data in an output report. The outlier identification element suitably performs the analysis at run time. The outlier identification element may also operate in conjunction with a smoothing system to smooth the data and identify trends and departures from test result norms.
AI classification
Ownership
TEST ADVANTAGE, INC.
assignment · 134580973
Assignors
TABOR, ERIC PAUL
On an employer assignment, the assignors are typically the inventors.