METHOD FOR QUANTIFYING THE MANUFACTURING COMPLEXITY OF ELECTRICAL DESIGNS

Patent №

US 8,645,875

Granted

2014-02-04

Filed 2010

Owner

Lab

AI components

2

vision · evo

Assignment

None on record

Dataset

AIPD

2023_r1 edition

Application

12914367

A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design.

VisionEvolutionary computationG01R 31/2848G06T 7/0006G06T 2207/30141

AI classification

Vision1.00
Evolutionary computation0.75
AI hardware0.27
Machine learning0.13
Knowledge representation0.08
Natural language0.00
Planning0.00
Speech0.00
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