TEST ASSISTANT SYSTEM FOR LOGICAL DESIGN PROCESS

Disclosed is a test assistant system for a logical design process comprising a description storage data base for storing statements expressing logical functions of circuit components to be tested, a compiler for compiling the statements to output object data, a data base for storing the object data, a test pattern generator for generating test patterns by using the object data stored in the data base, a test pattern data base for storing the test patterns, each having a level number, a simulator for executing a simulation for the logical function by using the test patterns stored in the test pattern data base, and a display for displaying the object data, the test patterns, the information used in the simulation, and relationships among them. The data base comprises a region for storing a statement correspondence table expressing statements as descriptions of the logical functions of the circuit components, a region for storing a circuit component table expressing a circuit component corresponding to the function described in the statement, a region for storing a dependent relationship table expressing the dependent relationship between the statements, and a correspondence relationship table expressing the correspondence relationship between the statement correspondence table and the circuit component table.