Patent №
US 6,408,219
Granted
2002-06-18
Filed 1998
Owner
APPLIED MATERIALS, INC.
Lab
—
AI components
4
ml · vision · kr · planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09075254
A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.
AI classification
Ownership
APPLIED MATERIALS, INC.
assignment · 94330705
Assignors
YARON, GAD, LAMEY, PATRIC, MAIMON, AMOTZ
On an employer assignment, the assignors are typically the inventors.